Rentgenski difraktometer (XRD)

PANalytical X’Pert PRO MPD

PANalytical X’Pert PRO MPD X-ray Diffractometer (XRD)

Excerpt from the service report:
Device: PANalytical X’Pert PRO MPD
Created on: 07/07/2021

Work performed:
- Reinstallation and commissioning of the system
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- Connection of external supply lines
- Warm-up phase
- Complete alignment of the goniometer and other components
- Maintenance performed, including replacement of defective parts
Spare parts used:
L 3.6V NC/U3 R15.0X52.0 BATTERY, NI-CD
FAN FOR X-CELERATOR UNIT FAN
FILTER, WATER
Motor PW3050
(“Device was not tested in-house”)

The X’Pert PRO MPD is a highly versatile and powerful X-ray diffractometer (XRD) for structural characterization of crystalline materials. It is ideal for both pure research as well as routine applications in industry and academia. Thanks to its modular design, fast detection, and control of temperature and atmosphere, it is excellently suited for routine analyses as well as complex in-situ experiments.

Key features:
Multiple measurement geometries:
- Reflection in Bragg-Brentano (θ–2θ) mode
- Transmission geometry for powders in capillaries
- Optional SAXS (Small-Angle X-ray Scattering) for nanostructures
Radiation source and detectors:
- Typically copper anode (Cu-Kα, λ ≈ 1.54 Å)
- X’Celerator detector (1D, ultra-fast) for parallel data acquisition
Modular system with PreFIX technology:
- Fast exchange of optics and sample stages without recalibration
In-situ measurements at high temperatures:
- Measurements possible up to approx. 1200°C
- Controlled atmosphere: air, nitrogen, oxygen (limited for reducing conditions)

Typical applications:
- Phase analysis and quantitative Rietveld evaluation
- Determination of crystallite size, microstrain, residual stress
- In-situ investigation of phase transitions, oxidation, crystallization, etc.
- SAXS measurements for analysis of nanoparticles, pore structures
- Broad range of sample types: powders, thin films, ceramics, pharmaceuticals, catalysts, and more

Technical data (typical):
Property / Specification
Angle range (2θ): approx. 0.5° to 150°
Step width: up to 0.002° or finer
Goniometer: Vertical, θ–θ, radius approx. 240 mm
Temperature range: Room temperature up to approx. 1200 °C
Atmosphere: Air, N₂, O₂ (limited reducing)
Detectors: X’Celerator (1D), proportional counter

Distribution & usage locations:
The X’Pert PRO MPD is deployed worldwide, for example at:
- Universities (ETH Zurich, TU Dresden, University of Vienna)
- Research institutes (e.g. Max Planck Institutes, ICN2, IS2M)
- Industry (e.g. materials development, pharma, chemicals)

Condition: used
Scope of delivery: (see photo)
(Subject to change and errors in the technical data. Specifications are subject to confirmation!)

We are happy to answer any questions you may have by phone.

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