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unbekannt CTX125 X-RAY System Kontrolleinheit

Leto izdelave: 2025, Stanje: novo, X-ray inspection system for medium-sized packs and pouches. Suitable for the detection of foreign objects such as metal, glass, stone, plastic, etc., in food or non-food products. Tjdpov Nm Inefx Abgof Specifications: Conveyor belt width: 410 mm; Detection sensitivity: Pb from Ø 0.2 mm, Fe from Ø 0.28 mm, SUS from Ø 0.28 mm, non-metallic (e.g. stone, glass) from Ø 1.2 mm; X-ray output: 80 kVp, 1.25 mA; Detector resolution: 0.4 mm; X-ray emission: < 1 µSv/h; Conveyor belt height: 850 ± 30 mm; Conveyor belt speed (product-dependent): 10–100 m/min; User interface: 15" touchscreen; Software: intellisens®X-ray; Operating temperature: 5–35 °C; Ejection system: optionally available as required; Power supply: 220VAC, 50/60Hz; System dimensions: L900 x W920 x H1825 mm; Weight: 350 kg. Please note that our new prices are often below conventional used prices. Feel free to send us an enquiry and describe your specific packaging application. We typically have 30–50 different new machines available ex stock for immediate delivery. For custom-built equipment, we offer very short lead times, starting from approximately 3 weeks. All machines are supplied with a full warranty.

Stanje: Okvarjen nosilec rezervnih delov (rabljen), Oxford Instruments X-Strata 960 X-ray Fluorescence Analyzer – For Parts / Defective Tsdpehaapfjfx Abgsf Item Description: For sale is a used X-ray fluorescence analyzer, model Oxford Instruments X-Strata 960. The unit was removed from a laboratory and is offered solely as a donor for spare parts or for repair purposes. No functionality test has been performed – therefore, the device is considered defective for the purpose of this sale. Technical Specifications – Oxford Instruments X-Strata 960 (non-binding) Feature Description Model X-Strata 960 Manufacturer Oxford Instruments Analysis Method X-ray Fluorescence Analysis (XRF) Application Areas Coating thickness measurement, materials analysis, precious metal testing Measurement Geometry Top-down or bottom-up irradiation, depending on configuration Radiation Source X-ray tube (e.g., Rhodium anode), 50–100 W output Detector Proportional counter or Silicon Drift Detector (SDD), depending on version Measurement Range Coating thickness approx. 0.005 – 50 µm (material-dependent) Spot Size Approx. 15 μm – 1 mm (depending on collimator) Z-Axis Motorized travel, up to approx. 230 mm measurement height Sample Chamber (W × D × H) Approx. 580 × 510 × 230 mm Sample Table Manual or motorized (200 × 200 mm or larger, depending on configuration) Focusing System Optical / Laser focus, partially automatic Operating System Integrated industrial PC with Windows-based evaluation software Power Supply 220–240 V / 50–60 Hz / approx. 500–800 W Device Weight Approx. 150–200 kg (depending on configuration) Condition: Used / Defective / For Spare Parts Scope of Delivery: As shown in the images – no accessories or software included Important Notes: This item is expressly sold as a defective unit with no functional guarantee. The product is offered as a parts donor or for repair projects. No guarantee for functionality, completeness, or technical specifications. Commercial sale excluding any liability for material defects, pursuant to § 447 BGB (shipment purchase). Scope of Delivery: - Oxford Instruments X-Strata 960 - All components visible in the photos - No additional parts, accessories, or documentation included unless explicitly listed. Shipping & Collection: - Collection in Borken possible and preferred - Shipping can be arranged upon request. (Changes and errors in the technical data and information reserved!) For further questions, please feel free to contact us by phone.

Leto izdelave: 2016, Stanje: zelo dobro (rabljeno), Automatic X-Ray Inspection For the inspection of BGA, QFN, THT, LED, LGA, and other solder joints, whether visible or hidden. Other features: Including offline station and repair station Operating system: Windows 7 Ultra-high speed line-scan CCD detectors Inspection area: 450 mm x 400 mm Image capture: 2D, 2.5D, 3D (layer images with planar CT) PCB dimensions: 60 - 450 x 50 - 400 mm AXI resolution: 6 - 30 µm / px AOI: Camera field of view: 42 mm x 42 mm Resolution: 21 µm Inspection height: -3 to 7.5 mm Optics: telecentric Transport height: 950 mm +/- 25 mm Todpfewpuadjx Abgof Interface: SMEMA Automatic width adjustment

Leto izdelave: 2016, Stanje: pripravljen za uporabo (rabljen), A like-new Anritsu X-ray inspection system is available. X-ray power: 100W, max. detection width: 240mm, max. detection height: 120mm, detection speed for 2kg to 5kg: 10m-60m/min, detection speed up to 2kg: 60m-90m/min, detection speed for 5kg to 10kg: 10m-40m/min. Housing material: stainless steel. Machine weight: approx. 255kg. Operating hours: less than 50h. The machine shows no wear on the conveyor belt or on the radiation protection curtains. Documentation is available. An on-site inspection is possible. Tsdpfx Aovzr Auobgef

Stanje: rabljeno, PANalytical X’Pert PRO MPD X-ray Diffractometer (XRD) Excerpt from the service report: Device: PANalytical X’Pert PRO MPD Created on: 07/07/2021 Work performed: - Reinstallation and commissioning of the system - Connection of external supply lines - Warm-up phase - Complete alignment of the goniometer and other components - Maintenance performed, including replacement of defective parts Spare parts used: L 3.6V NC/U3 R15.0X52.0 BATTERY, NI-CD FAN FOR X-CELERATOR UNIT FAN FILTER, WATER Motor PW3050 (“Device was not tested in-house”) The X’Pert PRO MPD is a highly versatile and powerful X-ray diffractometer (XRD) for structural characterization of crystalline materials. It is ideal for both pure research as well as routine applications in industry and academia. Thanks to its modular design, fast detection, and control of temperature and atmosphere, it is excellently suited for routine analyses as well as complex in-situ experiments. Tedpfewycatsx Abgsf Key features: Multiple measurement geometries: - Reflection in Bragg-Brentano (θ–2θ) mode - Transmission geometry for powders in capillaries - Optional SAXS (Small-Angle X-ray Scattering) for nanostructures Radiation source and detectors: - Typically copper anode (Cu-Kα, λ ≈ 1.54 Å) - X’Celerator detector (1D, ultra-fast) for parallel data acquisition Modular system with PreFIX technology: - Fast exchange of optics and sample stages without recalibration In-situ measurements at high temperatures: - Measurements possible up to approx. 1200°C - Controlled atmosphere: air, nitrogen, oxygen (limited for reducing conditions) Typical applications: - Phase analysis and quantitative Rietveld evaluation - Determination of crystallite size, microstrain, residual stress - In-situ investigation of phase transitions, oxidation, crystallization, etc. - SAXS measurements for analysis of nanoparticles, pore structures - Broad range of sample types: powders, thin films, ceramics, pharmaceuticals, catalysts, and more Technical data (typical): Property / Specification Angle range (2θ): approx. 0.5° to 150° Step width: up to 0.002° or finer Goniometer: Vertical, θ–θ, radius approx. 240 mm Temperature range: Room temperature up to approx. 1200 °C Atmosphere: Air, N₂, O₂ (limited reducing) Detectors: X’Celerator (1D), proportional counter Distribution & usage locations: The X’Pert PRO MPD is deployed worldwide, for example at: - Universities (ETH Zurich, TU Dresden, University of Vienna) - Research institutes (e.g. Max Planck Institutes, ICN2, IS2M) - Industry (e.g. materials development, pharma, chemicals) Condition: used Scope of delivery: (see photo) (Subject to change and errors in the technical data. Specifications are subject to confirmation!) We are happy to answer any questions you may have by phone.

Stanje: dober (rabljeno), Helmut Fischer Fischerscope X-ray fluorescence coating thickness gauge XDL- XYmZ Tjdew Hbkdjpfx Abgef