Vickers Instruments Binocular Microscope nakup rabljenega (1.533)

Stanje: zelo dobro (rabljeno), Funkcionalnost: popolnoma funkcionalen, Mitutoyo glava mikroskopa, FS70Z Model: FS70Z Stanje: Rabljeno Splošno: Ohišje laserskega video mikroskopa 1X/2X, fokusna razdalja 50 mm (FS70Z) Mitutoyo-378-185-1 Dodatki: Hsdpfezh I R Rjx Afaop Dokumentacija

Stanje: novo, VHX-600E, Keyence Digital Microscope - New Model: VHX-600E Type: VHX-600E Hodpfjq S Ti Eex Afaop Condition: New

Stanje: novo, Leto izdelave: 2026, Funkcionalnost: popolnoma funkcionalen, trajanje garancije: 12 meseci, vhodna napetost: 230 V, merilno območje os X: 200 mm, merilno območje osi Y: 85 mm, merilno območje os Z: 50 mm, skupna širina: 483 mm, skupna dolžina: 598 mm, skupna višina: 464 mm, skupna masa: 64 kg, vhodni tok: 5 A, natančnost ponavljanja: 0,005 mm, vhodna frekvenca: 50 Hz, Oprema: CE označba, Na voljo je tipska ploščica, USB priključek, dokumentacija / priročnik, PG1000-400 – optični sistem za kontrolo geometrije rotacijskih rezilnih orodij PG1000-400 je profesionalni optični merilni in kontrolni sistem za hitro preverjanje geometrije rezilnih orodij. Namenjen je proizvajalcem orodij, brusionicam, orodjarnam, CNC obratom ter oddelkom za kontrolo kakovosti in meroslovje. Glavna uporaba je kontrola rotacijskih rezilnih orodij po izdelavi, brušenju, ostrenju ali obnovi. Sistem je primeren za HSS in monolitna karbidna orodja, zlasti svedre, končne rezkarje, stopničaste svedre, povrtala, narezovalce, profilna orodja, mikro orodja ter specialna orodja po naročilu. Napravo je mogoče uporabiti tudi za kontrolo ploščic VBD, izbranih navojev, vijakov / zatičev in drugih natančnih delov, če je kontrolirana geometrija optično dostopna s kamero. Primarna namembnost sistema je kontrola geometrije rezilnih orodij. Tipične uporabe: - medoperativna kontrola neposredno ob brusilnem stroju ali v proizvodnji - vhodna in izhodna kontrola orodij - kontrola po ostrenju / brušenju - dokumentacija kakovosti in merilni protokoli - ponavljajoča kontrola serijsko izdelanih orodij PG1000-400 omogoča kontrolo npr.: - hrbtni in čelni kot - kot vijačnice (helix angle) - konični kot pri svedrih - radije in kotne radije - premer in razdalje - dolžino rezalnega roba (length of cut) - širino pasu, robne širine, fazete - debelino jedra (web thickness) - profil orodja - tirnost / radijalni udar - stanje in obraba rezilnega roba - primerjava geometrije z DXF/DWG risbami Sistem deluje optično in brezkontaktno. To je prednost pri pregledu ostrih rezil, fine mikrogeometrije, prevlečenih in preciznih orodij, kjer so pomembni hitrost, ponovljivost in zmanjšanje vpliva operaterja. Sestavni del sistema je programska oprema REACTION, namensko razvita za kontrolo rezilnih orodij. Programska oprema omogoča več kot 50 merilnih funkcij, zaznavanje robov, pripenjanje merilnih točk na robove, shranjevanje kontrolnih scenarijev, primerjavo z DXF/DWG geometrijo, PDF protokole z oceno PASS/FAIL in izvoz podatkov v Excel/CSV. Tehnične specifikacije: - priporočljiv premer orodja: 0,635–75 mm - merilna dolžina orodja: cca 190–200 mm - razpon povečav: 12,5× do 145× - kamera: 5 MP - monitor: 27" 4K Ultra HD - merilno območje: 85 mm vertikalno × 200 mm horizontalno - natančnost / ponovljivost: ±5 µm pri maksimalni povečavi - dimenzije naprave: cca 598 × 483 × 464 mm - masa: cca 64 kg Ponujena konfiguracija: - PG1000-400 optični sistem za kontrolo rezilnih orodij - M/F/A enkoderji - PC s programsko opremo REACTION - 27" 4K Ultra HD monitor - prilagodljiva LED osvetlitev z difuzorjem - ukrivljena magnetna difuzijska plošča - rotacijski osnovni blok za vpenjalne priprave - 1000-026-5"-ASS – 5" V-block z vložkom, zgornjim pritiskom in ustavljalcem - osnovno daljinsko usposabljanje operaterja Hsdpfx Aozdz S Tefaop O proizvajalcu: PG1000 temelji na dolgoletnem razvoju sistemov za kontrolo rezilnih orodij. Prva generacija PG1000 je bila predstavljena leta 1993. Sistem proizvaja podjetje PG Inspection Technologies LLC v ZDA, specializirano za to linijo izdelkov. Od leta 1996 je bilo dobavljenih več kot 1000 sistemov PG1000. Stanje in dostava: - nov stroj - letnik: 2026 - garancija: 12 mesecev - lokacija: Češka republika / EU - dostava, pomoč pri zagonu in usposabljanje po dogovoru - CE oznaka in ustrezna EU dokumentacija Naprava se ponuja prek evropskega zastopnika proizvajalca. Prodaja, tehnična podpora, zagon, garancijski in pogarancijski servis so zagotovljeni iz Evropsk

Stanje: nepreverjeno (rabljeno), 1 lot merskih naprav Proizvajalec: Gossen, Tip: Metrawatt, Metratester 4, Profitest 204, Secutest S2 Hjdpfx Afozg D Txsaop

Stanje: Okvarjen nosilec rezervnih delov (rabljen), Vickers Type: HVS 1000 The digital micro Vickers hardness tester HVS 1000 features a unique and precise design in mechanics, optics, and light source, capable of generating a clearer impression image and therefore more accurate measurements. Main purpose and application areas: 1. Iron and steel, non-ferrous metals, metal foil, hard alloys, sheet metal, microstructures 2. Carburizing, nitriding and decarburization layers, surface hardening layers, coating, platings 3. Glass, wafers, ceramic materials Specifications: Model: HVS1000 Type: Digital Micro Hardness Tester Test forces (N): 0.098 / 0.246 / 0.49 / 0.98 / 1.96 / 2.94 / 4.90 / 9.80 Test forces (Kgf): 10 / 25 / 50 / 100 / 200 / 300 / 500 / 1000 Load control: Automatic loading and release Objective-indenter turret: Manual Dwell time (s): 0~60 Microscope magnification: 400x for measurement, objective 40x, eyepiece 10x 100x for observation, objective 10x, eyepiece 10x Micrometer resolution (μm): 0.01 Hsdpozgbr Sefx Afaep Test range: 5 HV~3000 HV XY-test table dimensions: 100 x 100 mm XY-test table movement range: 25 x 25 mm Max. specimen height: 120 mm Max. specimen width: 110 mm Hardness conversion: HK, HRA, HRB, HRC, HRD, HR15N, HR30N, HR45N, R15T, HR30T, HR45T, HV, HBW Output: Built-in printer, RS232 interface Power supply: 220V, 60/50Hz Dimensions (mm): 441 x 270 x 480 Net weight (kg): 35 Condition: used Scope of delivery: (see image) (Specifications subject to change and error!) Additional questions are gladly answered by phone.

Stanje: rabljeno, TECHNICAL DATA Hedpfsug U Rmex Afaop - Magnification: W 10 x 21 B

Stanje: rabljeno, TECHNICAL DATA - Magnifications: 6.4x, 10x, 16x, 40x - W 10/23 Hsdpfeug U Rtjx Afaop

Stanje: rabljeno, TECHNICAL DATA - Objectives: 1.5X and 0.5X Hsdeug U Rgspfx Afaop - Light source: OLYMPUS HIGHLIGHT 3001

Stanje: zelo dobro (rabljeno), Type: Jeol JSM-6490 Jeol JSM-6490 Scanning Electron Microscope (PC-SEM) Modern, high-resolution, digital scanning electron microscope featuring newly developed electron optics and an intuitive graphical user interface (GUI) operating on Microsoft Windows XP Professional. Hsdpozd Ufaefx Afaop Instrument configuration includes the following features: - Magnification range: 5x - 300,000x - Accelerating voltage: 0.3 - 30 kV - Tungsten hairpin cathode (LaB6 cathode optional) - Large fully motorized specimen stage with eccentric tilt, including: - Graphical navigation on the specimen holder - Easy sample navigation via click-center-zoom - Field-of-view controlled navigation using two navigators - Relative coordinate navigation - Save and recall sample positions - Adjustable specimen stage field-of-view process - Field-of-view correction during rotation via computer-controlled eccentric rotation - Field-of-view correction during tilting via computer-controlled eccentric tilt - Calculation of possible tilt angle based on sample geometry - Automatic focus tracking when moving the sample in the Z-direction - Intelligent limit switches for the motorized axes Specimen stage travel range: - x = 125 mm - y = 100 mm - z = 5 to 80 mm (stepless) - T = -10°C to +90°C - R = 360° (continuous) - Secondary electron detector for high vacuum operation - Innovative superconical objective lens to ensure highest image resolution even at high tilt angles - Guaranteed SE image resolution: 3 nm at 30 kV and 15 nm at 1 kV - Simultaneous live image display from multiple detectors - Easy sample navigation via click-center-zoom - Powerful image measurement functions - Movie function for recording dynamic processes - Versatile sample chamber with various expansion options: free flanges (e.g., for EDX, WDX, EBSD, cathodoluminescence, etc.) - Maintenance- and wear-free, quiet pumping system consisting of forepump, vibration-free high-performance diffusion pump, and electromagnetic valve control - Extensive fault protection to prevent operator error and external media failure - Ergonomic, height-adjustable system table - SEM starter kit including 2 sample holders, tool kit, and 6 spare cathodes Additional equipment for scanning electron microscope: - Turbomolecular pump instead of standard diffusion pump - When using a turbomolecular pump, no cooling water is required for SEM operation. Additional SEM equipment: - PC for SEM control including TFT monitor - ΟΧ200 Bruker Quantax 200 EDX System EXTENDED - Bruker EDX software license will be transferred to the new owner upon purchase! - Nitrogen-free, energy-dispersive X-ray analysis system including: - SDD detector with 127 eV or better energy resolution - Detection of all elements from boron upwards - Vibration-free, maintenance-free, Peltier-cooled (nitrogen-free) - Pulse processor - TFT monitor - Spectrum measurement and element identification - Fully automatic, quantitative, standards-free element analysis - Image acquisition - Ultra-fast qualitative line scan - Ultra-fast qualitative element mapping - Data management and archiving system - Report generation and results output - Data communication - Installation and instruction - HyperMap - Multipoint analysis - Bruker xFlash detector (SDD) with SVE III signal processing unit Scope of delivery: (See photos) Condition: used (Subject to change and errors in the technical data and specifications!)

Stanje: zelo dobro (rabljeno), TAMAR Type: FEMET_WI_ID071_TAMAR Light Microscope PLMIS Light Microscope The TAMAR light microscope ID071 is used for the optical inspection of samples with a maximum size of approx. 780x650mm² (substrate size) in the PLG cleanroom. Substrate size: complete substrate size (780x650mm²) Objective: The objective lens focuses the light emitted from the observed object into a real image for the viewer. Brightfield mode (BF): The light from the microscope is directed onto the sample through the objective lens. High resolution, low contrast. Darkfield mode (DF): Illumination mode for contrast enhancement, providing high contrast for edges and particles. Principle: The center of the incident light beam is blocked, and only peripheral light is directed through the objective and hits the sample from the side. As a result, edges and particles appear bright, while the smooth background appears dark. Hedpfxozd Sqmj Afajp TAMAR Light Microscope ID071 X-Y stage Software Revision 1.0 Condition: used Scope of delivery: (autosampler as shown) (Changes and errors in technical data and specifications are reserved!) If you have further questions, we are happy to assist you by phone.

Stanje: zelo dobro (rabljeno), Shimadzu Type: Prestige-21 / with AIM-8800 infrared microscope Shimadzu IR Prestige-21 infrared spectrophotometer The IRPrestige-21 is designed for both highly sensitive and broad applications in research and development. It is an excellent addition to the already existing FTIR series, which covers, among other things, the standard laboratory range. AIM-8800 Specifications Optics: 15x Cassegrain objective 15x Cassegrain condenser mirror with purge inlet MCT detector: with liquid nitrogen monitoring system Wavelength range: Type 1 - 5000 - 720 cm⁻¹ Type 2 - 5000 - 650 cm⁻¹ Electrically actuated aperture XY Θ directional drive. The adjustment increments for the XY directions are 1 µm above the sample surface and 1° steps in Θ direction (numeric input possible). Minimum setting value: 3 µm Motorized XY sample stage Positioning range: X-axis: 70 mm; Y-axis: 30 mm. Resolution: 1 µm spacing Sample thickness: Reflection mode – ≤ 40 mm Transmission mode – ≤ 10 mm Operation via the main device keyboard Selection of measurement mode / XY stage operation (four-step speed control) / manual focusing / illumination control Hsdpfx Afszdyyisajp (Optional) Control via PC Selection of measurement mode / XY stage operation / auto-centering / manual focusing / auto-focusing / illumination control / aperture adjustment / aperture preview / measurement position and recording of aperture settings (10 sample positions, 2 background positions) Environmental conditions: Ambient temperature: 15°C ~ 30°C Humidity: 70% or less External dimensions, weight: W410 mm x D540 mm x H520 mm x 36 kg Condition: used Scope of delivery: (see image) (Specifications are subject to change and errors excepted!) For further questions, please feel free to contact us by phone.

Stanje: zelo dobro (rabljeno), ZEISS Type: DSM 962 The digitized scanning electron microscope DSM 962 is equipped with an integrated 4 MB image memory, a 40 MB hard drive for internal image storage, as well as drives for external data and image transfer. This allows users to quickly and easily obtain detailed information about the composition and morphology of specimen surfaces down to the sub-micrometer range. With a magnification range of 5x to 300,000x, both macrostructure and microstructure analysis are possible. The application range can be significantly extended with special accessories, enabling, for example, analytical investigations in microscopic surface areas. The device can be operated either via conventional control elements or a keyboard and mouse (optional). Electron optics and vacuum control use conventional operation. Image memory functions are controlled via the keyboard or mouse (optional). Centrally positioned on the control panel is a separate info screen for menu display. This manual is intended as a guide to help users achieve the best possible results with the device. The explanations have been kept as simple as possible to provide all users, including those with limited experience, with necessary guidance. Magnification range: 20x to 300,000x at 7 mm working distance Steps in a sequence of 1-2-3-5-10 Minimum magnification: 5x at 50 mm working distance Resolution: 4 nm - guaranteed with tungsten cathode at 30 kV, 6 mm working distance, un-tilted sample 25 nm - guaranteed with tungsten cathode at 1 kV, 6 mm working distance, un-tilted sample 3.5 nm - guaranteed with optimal LaB6 cathode at 30 kV, 6 mm working distance, un-tilted sample Hodpfx Afjzdthyeasp Scope of delivery: (DSM 962 with accessories as shown) Condition: used (Specifications and technical details subject to change and error!) Please inquire about transport options before purchase. For further questions, feel free to contact us by phone.

Stanje: dober (rabljeno), Here we offer a handling device from ZASCHESitec. This device was used in the production of instrument panels. It consists of the following components: KBK - FPM 10 - 7.0 x 5.0 Trolley - LWK 762 x 762 Lifting module - Z-L6 - 80/1280 - 1486 Hedpfx Ajzdim Hefasp Load handling attachment - GP10 Load capacity: 10 kg Scope of delivery: (ZASCHESitec handling device, technical documentation) Condition: used If you have any further questions, we would be glad to assist you by phone. Written orders are possible via email or fax.

Leto izdelave: 2014, stanje: novo, digital length measuring device, manufacturer Heidenhain ID 355 533-04 glass scale type LF 481 – output signal 1Vpp – measuring length 200mm Hedeb T Uqispfx Afaop

Stanje: rabljeno, tool measuring device manufacturer: Mitutoyo Hodpjddtuyofx Afajp type: Quickset R

Stanje: zelo dobro (rabljeno), Microscope Hjdpfjd Iacwsx Afajp Magnifying glass Manufacturer: Hartmann Model: Accu Lux 20x magnification In wooden case With operating manual

Stanje: pripravljen za uporabo (rabljen), Sensor Instruments L-LAS-TB-16x1-R-CL laserski prehodni linijski senzor 47/16 04078-R, rabljen, v dobrem stanju, 100% delujoč, dobava skladno s fotografijami. Hedpfx Aex Eugiefasp

Stanje: pripravljen za uporabo (rabljen), Sensor Instruments L-LAS-TB-16x1-T-CL laserski senzorski vrstični senzor za prehodno svetlobo 04078-T, rabljen, dobro ohranjen, 100 % funkcionalen, obseg dobave po slikah. Hedjx Eug Aepfx Afasp

Stanje: pripravljen za uporabo (rabljen), Sensor Instruments L-LAS-TB-16x1-R-CL laserski presevni linijski senzor 29/16 03819-R, rabljen, dobro ohranjen, 100 % funkcionalen, dobava kot na fotografijah. Hjdpfx Aox Eugcofajp

Stanje: pripravljen za uporabo (rabljen), Sensor Instruments L-LAS-TB-16x1-R-CL laserski prehodni linijski senzor, rabljen, dobro ohranjen, 100% delujoč, obseg dobave kot na slikah. Hsdpfx Afex Eugpoaep

Stanje: pripravljen za uporabo (rabljen), Sensor Instruments L-LAS-TB-16x1-T-CL laserski prehodni linijski senzor 47/16 04077-T, rabljen, dobro ohranjen, 100% delujoč, obseg dobave po slikah. Hodsx Eugvjpfx Afajp

Stanje: pripravljen za uporabo (rabljen), Sensor Instruments L-LAS-TB-16x1-T-CL laserski presevni linijski senzor 47/16 04079-T, rabljen, dobro ohranjen, 100 % delujoč, dobava po slikah. Hsdpex Eug Nofx Afajp

Stanje: dober (rabljeno), Inverzni mikroskop Olympus CKX53SF, primeren za celično kulturo, opazovanje živih celic in splošno laboratorijsko uporabo. Hedpezhidfefx Afaep Ta konfiguracija je opremljena z integriranim faznim kontrastom (iPC) in vključuje več objektivov ter različne dodatke. Konfiguracija: Objektiv UPLFLN4xIPC/0,13 Objektiv CACHN10xIPC/0,25 Objektiv LCACHN20xIPC/0,40 Objektiv LCACHN40xIPC/0,55 Okular 10X/22 Vnaprej centriran fazno kontrastni drsnik CKX3-SLP Razni dodatki, vključno s platformami za pokrivna stekelca, drsniki in dodatno opremo Značilnosti: Inverzni mikroskop, idealen za aplikacije v celičnih kulturah iPC fazni kontrast za hitro in visokokontrastno opazovanje Profesionalna platforma Olympus, kompaktna in zelo primerna za laboratorijska okolja

Leto izdelave: 2019, stanje: dober (rabljeno), LEICA DMi1 Objektiv Leica HI PLAN I 20x/0,30 PH1 Objektiv Leica HI PLAN I 10x/0,22 PH1 Objektiv Leica HI PLAN 4x/0,10 Hsdpozhib Rjfx Afaop Drsnik Leica S40, ref. 11526113 Kondenzor Leica S40/0,45 Okular(i) Leica HC PLAN S 10x/20 Kamera Leica MC120 HD Digitalni zaslon za ogled v živo in interpretacijo

Leto izdelave: 2020, stanje: dober (rabljeno), Dobro vzdrževan inverzni mikroskop Leica DM IL LED Cellfactory, primeren za gojenje celic, fazni kontrast in rutinsko opazovanje živih celic. Konfiguracija: HI PLAN 4x/0.10 PH0 objektiv HI PLAN I 20x/0.30 PH1 objektiv HI PLAN I 20x/0.30 PH1 objektiv HI PLAN I 40x/0.50 PH2 objektiv Hsdpezhia Hjfx Afaop S40/0.45 Leica kondenzor (521251) HC C-mount 0,50x Drsnik HC Plan 10x/20 okular(-ji) Flexacam C1 z daljincem Razni dodatki Zanesljiva rešitev za laboratorije, biotehnologijo, raziskave in aplikacije za gojenje celic.