Skenirni elektronski mikroskop (PC-SEM)

Jeol JSM-6490 Bruker XFlash Detektor

Here we offer you a Jeol scanning electron microscope.

Jeol JSM-6490 Scanning Electron Microscope (PC-SEM)

Modern, high-resolution, digital scanning electron microscope with newly developed electron optics and intuitive, graphical user interface (GUI) running on Microsoft Windows XP Professional.

Magnification range: 5X - 300,000X
Accelerating voltage: 0.3 - 30 kV
Tungsten hairpin cathode (LaB6 cathode optional)
Large, fully motorized specimen stage with true eucentric tilt, incl.
Graphical navigation on specimen holder
Easy specimen navigation via Click-Center-Zoom
Field-of-view controlled navigation via two navigators
Relative coordinates navigation
Storing and recalling specimen positions
Adjustable field-of-view selection method for the specimen stage
Field-of-view correction during rotation via computer-controlled eucentric rotation
Fodpfomn Rcqsx Ah Dspn
Field-of-view correction during tilt via computer-controlled eucentric tilt
Calculation of possible tilt angle based on specimen geometry
automatic focus tracking during Z-axis movement
Intelligent limit switches for motorized axes

Specimen table travel range:
x = 125 mm
y = 100 mm
z = 5 to 80 mm (stepless)
T = -10°C to +90°C
R = 360° (endless)
Secondary electron detector for high vacuum operation
Innovative super conical objective lens guarantees top image resolution even at high tilt angles
Guaranteed resolution in SE image: 3 nm at 30 kV and 15 nm at 1 kV
Simultaneous live image display from multiple detectors
Easy specimen navigation via Click-Center-Zoom
Powerful image measurement functions
Movie function for capturing dynamic processes
Versatile sample chamber with numerous expansion options: free flanges e.g. for EDX, WDX, EBSD, cathodoluminescence, etc.
Low-maintenance, low-wear, quiet pumping system consisting of fore-vacuum pump, vibration-free high-performance diffusion pump, and electromagnetic valve control
Comprehensive fault protection against operating errors and failure of external media
Ergonomic, height-adjustable system table
SEM starter kit including 2 sample holders, tool set, and 6 spare cathodes

Additional Equipment

2x ΜΡ-43100 (TMP)
Turbomolecular pump instead of the standard diffusion pump
When using a turbomolecular pump, no cooling water is required to operate the SEM.

Additional equipment:

PC for SEM control
Including TFT monitor

ΟΧ200 Bruker Quantax 200 EDX-System EXTENDED
Nitrogen-free, energy-dispersive X-ray analysis system including:

SDD detector with 127 eV or better energy resolution
Detection of all elements from boron upwards
Vibration-free, maintenance-free, Peltier-cooled (nitrogen-free)
Pulse processor
TFT monitor
Spectrum measurement and element identification
Fully automatic, quantitative, standardless element analysis
Image acquisition
Ultra-fast qualitative LineScan
Ultra-fast qualitative element mapping
Data management and archiving system
Report generation and output
Data communication
Installation and training
HyperMap
Multipoint analysis

Bruker xFlash detector (SDD) with signal processing unit SVE III

Type: Jeol JSM-6490

Scope of delivery: (See photos)

Condition: used

(Specifications subject to change and errors excepted!)
Please feel free to contact us by telephone for any further questions.

Oglas je bil preveden samodejno, zaradi česar je morda prišlo do napak pri prevodu.