Skenirni elektronski mikroskop (PC-SEM)

Jeol JSM-6490 Bruker XFlash Detektor

Type: Jeol JSM-6490

Jeol JSM-6490 Scanning Electron Microscope (PC-SEM)

Modern, high-resolution, digital scanning electron microscope featuring newly developed electron optics and an intuitive graphical user interface (GUI) operating on Microsoft Windows XP Professional.

Ffodpfxemn Rcqe Afljt
Instrument configuration includes the following features:

- Magnification range: 5x - 300,000x
- Accelerating voltage: 0.3 - 30 kV
- Tungsten hairpin cathode (LaB6 cathode optional)
- Large fully motorized specimen stage with eccentric tilt, including:
- Graphical navigation on the specimen holder
- Easy sample navigation via click-center-zoom
- Field-of-view controlled navigation using two navigators
- Relative coordinate navigation
- Save and recall sample positions
- Adjustable specimen stage field-of-view process
- Field-of-view correction during rotation via computer-controlled eccentric rotation
- Field-of-view correction during tilting via computer-controlled eccentric tilt
- Calculation of possible tilt angle based on sample geometry
- Automatic focus tracking when moving the sample in the Z-direction
- Intelligent limit switches for the motorized axes

Specimen stage travel range:
- x = 125 mm
- y = 100 mm
- z = 5 to 80 mm (stepless)
- T = -10°C to +90°C
- R = 360° (continuous)

- Secondary electron detector for high vacuum operation
- Innovative superconical objective lens to ensure highest image resolution even at high tilt angles
- Guaranteed SE image resolution: 3 nm at 30 kV and 15 nm at 1 kV
- Simultaneous live image display from multiple detectors
- Easy sample navigation via click-center-zoom
- Powerful image measurement functions
- Movie function for recording dynamic processes
- Versatile sample chamber with various expansion options: free flanges (e.g., for EDX, WDX, EBSD, cathodoluminescence, etc.)
- Maintenance- and wear-free, quiet pumping system consisting of forepump, vibration-free high-performance diffusion pump, and electromagnetic valve control
- Extensive fault protection to prevent operator error and external media failure
- Ergonomic, height-adjustable system table
- SEM starter kit including 2 sample holders, tool kit, and 6 spare cathodes

Additional equipment for scanning electron microscope:
- Turbomolecular pump instead of standard diffusion pump
- When using a turbomolecular pump, no cooling water is required for SEM operation.

Additional SEM equipment:
- PC for SEM control including TFT monitor
- ΟΧ200 Bruker Quantax 200 EDX System EXTENDED
- Bruker EDX software license will be transferred to the new owner upon purchase!
- Nitrogen-free, energy-dispersive X-ray analysis system including:
- SDD detector with 127 eV or better energy resolution
- Detection of all elements from boron upwards
- Vibration-free, maintenance-free, Peltier-cooled (nitrogen-free)
- Pulse processor
- TFT monitor
- Spectrum measurement and element identification
- Fully automatic, quantitative, standards-free element analysis
- Image acquisition
- Ultra-fast qualitative line scan
- Ultra-fast qualitative element mapping
- Data management and archiving system
- Report generation and results output
- Data communication
- Installation and instruction
- HyperMap
- Multipoint analysis
- Bruker xFlash detector (SDD) with SVE III signal processing unit

Scope of delivery: (See photos)
Condition: used

(Subject to change and errors in the technical data and specifications!)

Oglas je bil preveden samodejno, zaradi česar je morda prišlo do napak pri prevodu.