Skenirni elektronski mikroskop (PC-SEM)

Jeol JSM-6490 Bruker XFlash Detektor

Type: Jeol JSM-6490

Jeol JSM-6490 Scanning Electron Microscope (PC-SEM)

Modern, high-resolution, digital scanning electron microscope featuring newly developed electron optics and an intuitive graphical user interface (GUI) operating on Microsoft Windows XP Professional.

Instrument configuration includes the following features:

- Magnification range: 5x - 300,000x
- Accelerating voltage: 0.3 - 30 kV
- Tungsten hairpin cathode (LaB6 cathode optional)
- Large fully motorized specimen stage with eccentric tilt, including:
- Graphical navigation on the specimen holder
- Easy sample navigation via click-center-zoom
- Field-of-view controlled navigation using two navigators
- Relative coordinate navigation
- Save and recall sample positions
- Adjustable specimen stage field-of-view process
- Field-of-view correction during rotation via computer-controlled eccentric rotation
- Field-of-view correction during tilting via computer-controlled eccentric tilt
- Calculation of possible tilt angle based on sample geometry
- Automatic focus tracking when moving the sample in the Z-direction
- Intelligent limit switches for the motorized axes

Specimen stage travel range:
- x = 125 mm
- y = 100 mm
- z = 5 to 80 mm (stepless)
- T = -10°C to +90°C
- R = 360° (continuous)

- Secondary electron detector for high vacuum operation
- Innovative superconical objective lens to ensure highest image resolution even at high tilt angles
- Guaranteed SE image resolution: 3 nm at 30 kV and 15 nm at 1 kV
- Simultaneous live image display from multiple detectors
- Easy sample navigation via click-center-zoom
- Powerful image measurement functions
- Movie function for recording dynamic processes
- Versatile sample chamber with various expansion options: free flanges (e.g., for EDX, WDX, EBSD, cathodoluminescence, etc.)
- Maintenance- and wear-free, quiet pumping system consisting of forepump, vibration-free high-performance diffusion pump, and electromagnetic valve control
- Extensive fault protection to prevent operator error and external media failure
- Ergonomic, height-adjustable system table
- SEM starter kit including 2 sample holders, tool kit, and 6 spare cathodes

Additional equipment for scanning electron microscope:
- Turbomolecular pump instead of standard diffusion pump
- When using a turbomolecular pump, no cooling water is required for SEM operation.

Additional SEM equipment:
- PC for SEM control including TFT monitor
- ΟΧ200 Bruker Quantax 200 EDX System EXTENDED
- Bruker EDX software license will be transferred to the new owner upon purchase!
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- Nitrogen-free, energy-dispersive X-ray analysis system including:
- SDD detector with 127 eV or better energy resolution
- Detection of all elements from boron upwards
- Vibration-free, maintenance-free, Peltier-cooled (nitrogen-free)
- Pulse processor
- TFT monitor
- Spectrum measurement and element identification
- Fully automatic, quantitative, standards-free element analysis
- Image acquisition
- Ultra-fast qualitative line scan
- Ultra-fast qualitative element mapping
- Data management and archiving system
- Report generation and results output
- Data communication
- Installation and instruction
- HyperMap
- Multipoint analysis
- Bruker xFlash detector (SDD) with SVE III signal processing unit

Scope of delivery: (See photos)
Condition: used

(Subject to change and errors in the technical data and specifications!)

Oglas je bil avtomatsko preveden. Možne so napake pri prevodu.