Bruker Microflex nakup rabljenega (4)

Stanje: rabljeno, Ta oglas je za Bruker microflex masni spektrometer (MALDI-TOF MS). Naprava je popolnoma delujoča in pripravljena za takojšnjo uporabo. Nedpfx Asxhdxqefmscu Bruker Microflex je spektrometer na osnovi matriksno podprte laserske desorpcije/ionizacije s časom poleta (MALDI-TOF MS), zasnovan predvsem za hitro identifikacijo mikroorganizmov, biomolekul (kot so proteini in peptidi) ter polimerov. Je del serije Bruker MALDI Biotyper. Ključne komponente: - Laserski vir: Dušikov ali trdninska laserska dioda (običajno 337 nm UV) - Ionski vir: Vakuumska komora z MALDI nosilno ploščico - Poletna cev: Meritve časa poleta ionov - Detektor: Pretvarja čase prihoda ionov v masni spekter - MALDI nosilna ploščica: Kovinska plošča za nanašanje vzorcev z matriko Delovanje (poenostavljeno): 1. Priprava vzorca: Analit zmešamo z MALDI matriko (npr. α-ciano-4-hidroksicinamična kislina). 2. Laserska ionizacija: Laser obsveti matriko in povzroči ionizacijo vzorca. 3. Pospeševanje ionov: Ioni so pospešeni v TOF analizator. 4. Detekcija: Meri se čas poleta; manjši ioni dosežejo detektor hitreje. 5. Spekter: Razmerje masa/naboj (m/z) je prikazano glede na intenziteto. Fizične lastnosti (približno): - Tloris: Namizna izvedba (cca 80 cm širine) - Teža: Približno 100–120 kg (odvisno od modela) - Napajanje: Standardna laboratorijska električna napeljava - Okolje: Zahteva čiste, stabilne temperaturne in vlažnostne pogoje

Stanje: rabljeno, Demontiert aus einer laufenden Einheit. Bitte sehen Sie sich auch unsere anderen Angebote an. Nedpfswxax Dex Afmscu

Stanje: rabljeno, Bruker Type: Tensor 27 IR Spectrometer Complete sample flexibility. Thanks to the improved QuickLock™ mechanism and locking button on the front, even bulky accessories can be installed quickly and, above all, safely. Additionally, the INVENIO can be equipped with three software-controlled beam outputs for a wide variety of external modules. Ncjdpsvwciksfx Afmeu FPA micro- and macro-imaging Variable external sample chamber (left or right) for customized experiments Fiber optic coupling to fiber probes for liquids and solids Integrating sphere Autosampler for liquids High-throughput analysis module HTS-XT Reflection unit for air-water phase boundary Much more! Condition: used Scope of delivery: (see photo) (Specifications and technical data subject to change and errors!) For further questions, feel free to contact us by phone.

Stanje: zelo dobro (rabljeno), Type: Jeol JSM-6490 Jeol JSM-6490 Scanning Electron Microscope (PC-SEM) Modern, high-resolution, digital scanning electron microscope featuring newly developed electron optics and an intuitive graphical user interface (GUI) operating on Microsoft Windows XP Professional. Instrument configuration includes the following features: - Magnification range: 5x - 300,000x - Accelerating voltage: 0.3 - 30 kV - Tungsten hairpin cathode (LaB6 cathode optional) Ncodpfx Aszd Ufajfmeu - Large fully motorized specimen stage with eccentric tilt, including: - Graphical navigation on the specimen holder - Easy sample navigation via click-center-zoom - Field-of-view controlled navigation using two navigators - Relative coordinate navigation - Save and recall sample positions - Adjustable specimen stage field-of-view process - Field-of-view correction during rotation via computer-controlled eccentric rotation - Field-of-view correction during tilting via computer-controlled eccentric tilt - Calculation of possible tilt angle based on sample geometry - Automatic focus tracking when moving the sample in the Z-direction - Intelligent limit switches for the motorized axes Specimen stage travel range: - x = 125 mm - y = 100 mm - z = 5 to 80 mm (stepless) - T = -10°C to +90°C - R = 360° (continuous) - Secondary electron detector for high vacuum operation - Innovative superconical objective lens to ensure highest image resolution even at high tilt angles - Guaranteed SE image resolution: 3 nm at 30 kV and 15 nm at 1 kV - Simultaneous live image display from multiple detectors - Easy sample navigation via click-center-zoom - Powerful image measurement functions - Movie function for recording dynamic processes - Versatile sample chamber with various expansion options: free flanges (e.g., for EDX, WDX, EBSD, cathodoluminescence, etc.) - Maintenance- and wear-free, quiet pumping system consisting of forepump, vibration-free high-performance diffusion pump, and electromagnetic valve control - Extensive fault protection to prevent operator error and external media failure - Ergonomic, height-adjustable system table - SEM starter kit including 2 sample holders, tool kit, and 6 spare cathodes Additional equipment for scanning electron microscope: - Turbomolecular pump instead of standard diffusion pump - When using a turbomolecular pump, no cooling water is required for SEM operation. Additional SEM equipment: - PC for SEM control including TFT monitor - ΟΧ200 Bruker Quantax 200 EDX System EXTENDED - Bruker EDX software license will be transferred to the new owner upon purchase! - Nitrogen-free, energy-dispersive X-ray analysis system including: - SDD detector with 127 eV or better energy resolution - Detection of all elements from boron upwards - Vibration-free, maintenance-free, Peltier-cooled (nitrogen-free) - Pulse processor - TFT monitor - Spectrum measurement and element identification - Fully automatic, quantitative, standards-free element analysis - Image acquisition - Ultra-fast qualitative line scan - Ultra-fast qualitative element mapping - Data management and archiving system - Report generation and results output - Data communication - Installation and instruction - HyperMap - Multipoint analysis - Bruker xFlash detector (SDD) with SVE III signal processing unit Scope of delivery: (See photos) Condition: used (Subject to change and errors in the technical data and specifications!)