Sistem za merjenje kontur in površin

Chotest SJ5760

High-Precision Profile Measuring Device | Excellent Condition | Ready for Immediate Use

For sale is a Chotest SJ-5760P, a high-precision contour measuring instrument designed for geometric profile analysis in quality management, toolmaking, mechanical engineering, and research. The device delivers accurate measurements, offering extensive freedom of movement and a stable granite base.

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Condition
• Used, technically inspected
• Fully functional
• Very well maintained

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Technical Highlights – Chotest SJ-5760P

Travel Ranges
• X-axis: 0–200 mm
• Z-axis: 0–450 mm
• Device dimensions: 800 × 450 × 1100 mm
• Weight: 220 kg

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Bledjx Db Stepfx Afqsr

Profile Measurement (SJ-5760P)
• Z1 measurement range: ±25 mm
• Resolution: 0.001 µm
• Measuring direction: Top / Down
• Measurement speed: 0.05–5 mm/s
• Positioning speed: X/Z up to 20 mm/s
• Measuring force: 10–150 mN, adjustable
• Guideway deviation: ≤1 µm / 200 mm

Accuracy
• X indication error: ±(0.5 + 0.015L) µm
• Z1 indication error: ±(0.5 + 0.05H) µm
• Distance: ±(0.8 + 0.02L) µm
• Radius: ≤(1 + R/15) µm
• Angle: ≤±45’’

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Key Features
• Ideal for precise contour and profile measurements
• Extremely high vertical resolution (0.001 µm)
• Very stable granite base for low-vibration measuring conditions
• Large travel ranges for diverse component geometries
• User-friendly and reliable measurement technology
• Suitable for micron-precise form measurements in laboratory and production environments

Oglas je bil preveden samodejno, zaradi česar je morda prišlo do napak pri prevodu.