Analizator velikosti delcev Analiza delcev
Beckman Coulter LS 13 320 SGL

Začetna cena brez DDV
7.480 €
Stanje
Rabljeno
Lokacija
Borken Nemčija
Analizator velikosti delcev Analiza delcev Beckman Coulter LS 13 320 SGL
Analizator velikosti delcev Analiza delcev Beckman Coulter LS 13 320 SGL
Analizator velikosti delcev Analiza delcev Beckman Coulter LS 13 320 SGL
Analizator velikosti delcev Analiza delcev Beckman Coulter LS 13 320 SGL
Analizator velikosti delcev Analiza delcev Beckman Coulter LS 13 320 SGL
Analizator velikosti delcev Analiza delcev Beckman Coulter LS 13 320 SGL
Analizator velikosti delcev Analiza delcev Beckman Coulter LS 13 320 SGL
Analizator velikosti delcev Analiza delcev Beckman Coulter LS 13 320 SGL
Analizator velikosti delcev Analiza delcev Beckman Coulter LS 13 320 SGL
Analizator velikosti delcev Analiza delcev Beckman Coulter LS 13 320 SGL
Analizator velikosti delcev Analiza delcev Beckman Coulter LS 13 320 SGL
Analizator velikosti delcev Analiza delcev Beckman Coulter LS 13 320 SGL
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Beckman Coulter LS 13 320 SGL
Beckman Coulter LS 13 320 SGL
Beckman Coulter LS 13 320 SGL
Beckman Coulter LS 13 320 SGL
Beckman Coulter LS 13 320 SGL
Beckman Coulter LS 13 320 SGL
Beckman Coulter LS 13 320 SGL
Beckman Coulter LS 13 320 SGL
Beckman Coulter LS 13 320 SGL
Beckman Coulter LS 13 320 SGL
Beckman Coulter LS 13 320 SGL
Beckman Coulter LS 13 320 SGL
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Podatki o stroju

Opis stroja:
Analizator velikosti delcev Analiza delcev
Proizvajalec:
Beckman Coulter
Model:
LS 13 320 SGL
Stanje:
zelo dobro (rabljeno)

Cena in lokacija

Začetna cena brez DDV
7.480 €
Lokacija:
Dunkerstrasse 29, 46325 Borken/Burlo, DE Nemčija
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Podrobnosti ponudbe

ID ponudbe:
A19461346
Št. reference:
50443
Nazadnje posodobljeno:
dne 06.08.2025

Opis

Particle Size Analyzer with Dry Powder System Module

Chodpfxowv Sice Aa Roc
Fast and Reproducible Results in Particle Analysis, Laser Diffraction, and Particle Counting

The Beckman Coulter LS 13 320 can determine the particle size and particle size distribution of a sample using light scattering. For larger particles, it utilizes Fraunhofer diffraction (see HELOS/KR information sheet). Thanks to Beckman Coulter’s Polarization Intensity Differential Scattering technology (PIDS), the instrument is also capable of analyzing particle sizes much smaller than the wavelength of conventional light.

During a PIDS analysis, the sample is irradiated with polarized light. If a sample particle is significantly smaller than the wavelength of the incident light, the electrons of the particle are stimulated by the oscillating electric field of the light beam. The electrons oscillate perpendicular to the light beam, creating an oscillating dipole moment. As a result, the particle emits light in all directions except in the polarization direction of the incident light. Depending on whether the excitation light is vertically or horizontally polarized, the measured signal intensity from the sample (Iv or Ih at a specific angle) differs. These values depend strongly on the ratio of particle size to wavelength. Therefore, during a PIDS measurement, the sample is measured at three different wavelengths, each with both vertical and horizontal polarization. An algorithm then calculates the particle size distribution from these measurements.

Dry Powder System (Tornado Module)
The Dry Powder System Module delivers reliable results ranging from 400 nm to 3500 µm for all types of homogeneous and heterogeneous samples that can be dry-dispersed.

Analytical size range: 400 nm to 3500 µm
– Measures the entire sample according to ISO 13 320
– Programmable obscuration setting for optimized sample feeding
– User-selectable vacuum pressure for maximum dispersion control

Advantages of the LS 13 320 Particle Size Analyzer
Excellent Data Reproducibility
Reproducibility is one of the most important factors in laser diffraction particle size analysis. Tighter product specifications enable the production of higher-quality bulk and particulate materials.

Measurement parameters: Particle size, particle size distribution

Measurement methods: Light diffraction, PIDS method

Measuring range: 0.017 μm to 2000 μm

Applications: Particle size measurement

Materials: Emulsions such as lotions and creams, dispersions such as paints and PCD

Software version 5.01

Voltage: 100-220/240 V

Including vacuum pump controller

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Registriran od: 2008

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