Analizator velikosti delcev Analiza delcevBeckman Coulter
LS 13 320 SGL
Analizator velikosti delcev Analiza delcev
Beckman Coulter
LS 13 320 SGL
Začetna cena brez DDV
7.480 €
Stanje
Rabljeno
Lokacija
Borken 

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Podatki o stroju
- Opis stroja:
- Analizator velikosti delcev Analiza delcev
- Proizvajalec:
- Beckman Coulter
- Model:
- LS 13 320 SGL
- Stanje:
- zelo dobro (rabljeno)
Cena in lokacija
Začetna cena brez DDV
7.480 €
- Lokacija:
- Dunkerstrasse 29, 46325 Borken/Burlo, DE
Klic
Podrobnosti ponudbe
- ID ponudbe:
- A19461346
- Št. reference:
- 50443
- Nazadnje posodobljeno:
- dne 06.08.2025
Opis
Particle Size Analyzer with Dry Powder System Module
Chodpfxowv Sice Aa Roc
Fast and Reproducible Results in Particle Analysis, Laser Diffraction, and Particle Counting
The Beckman Coulter LS 13 320 can determine the particle size and particle size distribution of a sample using light scattering. For larger particles, it utilizes Fraunhofer diffraction (see HELOS/KR information sheet). Thanks to Beckman Coulter’s Polarization Intensity Differential Scattering technology (PIDS), the instrument is also capable of analyzing particle sizes much smaller than the wavelength of conventional light.
During a PIDS analysis, the sample is irradiated with polarized light. If a sample particle is significantly smaller than the wavelength of the incident light, the electrons of the particle are stimulated by the oscillating electric field of the light beam. The electrons oscillate perpendicular to the light beam, creating an oscillating dipole moment. As a result, the particle emits light in all directions except in the polarization direction of the incident light. Depending on whether the excitation light is vertically or horizontally polarized, the measured signal intensity from the sample (Iv or Ih at a specific angle) differs. These values depend strongly on the ratio of particle size to wavelength. Therefore, during a PIDS measurement, the sample is measured at three different wavelengths, each with both vertical and horizontal polarization. An algorithm then calculates the particle size distribution from these measurements.
Dry Powder System (Tornado Module)
The Dry Powder System Module delivers reliable results ranging from 400 nm to 3500 µm for all types of homogeneous and heterogeneous samples that can be dry-dispersed.
Analytical size range: 400 nm to 3500 µm
– Measures the entire sample according to ISO 13 320
– Programmable obscuration setting for optimized sample feeding
– User-selectable vacuum pressure for maximum dispersion control
Advantages of the LS 13 320 Particle Size Analyzer
Excellent Data Reproducibility
Reproducibility is one of the most important factors in laser diffraction particle size analysis. Tighter product specifications enable the production of higher-quality bulk and particulate materials.
Measurement parameters: Particle size, particle size distribution
Measurement methods: Light diffraction, PIDS method
Measuring range: 0.017 μm to 2000 μm
Applications: Particle size measurement
Materials: Emulsions such as lotions and creams, dispersions such as paints and PCD
Software version 5.01
Voltage: 100-220/240 V
Including vacuum pump controller
Further products – new and used – can be found in our shop!
International shipping costs on request!
Oglas je bil preveden samodejno, zaradi česar je morda prišlo do napak pri prevodu.
Chodpfxowv Sice Aa Roc
Fast and Reproducible Results in Particle Analysis, Laser Diffraction, and Particle Counting
The Beckman Coulter LS 13 320 can determine the particle size and particle size distribution of a sample using light scattering. For larger particles, it utilizes Fraunhofer diffraction (see HELOS/KR information sheet). Thanks to Beckman Coulter’s Polarization Intensity Differential Scattering technology (PIDS), the instrument is also capable of analyzing particle sizes much smaller than the wavelength of conventional light.
During a PIDS analysis, the sample is irradiated with polarized light. If a sample particle is significantly smaller than the wavelength of the incident light, the electrons of the particle are stimulated by the oscillating electric field of the light beam. The electrons oscillate perpendicular to the light beam, creating an oscillating dipole moment. As a result, the particle emits light in all directions except in the polarization direction of the incident light. Depending on whether the excitation light is vertically or horizontally polarized, the measured signal intensity from the sample (Iv or Ih at a specific angle) differs. These values depend strongly on the ratio of particle size to wavelength. Therefore, during a PIDS measurement, the sample is measured at three different wavelengths, each with both vertical and horizontal polarization. An algorithm then calculates the particle size distribution from these measurements.
Dry Powder System (Tornado Module)
The Dry Powder System Module delivers reliable results ranging from 400 nm to 3500 µm for all types of homogeneous and heterogeneous samples that can be dry-dispersed.
Analytical size range: 400 nm to 3500 µm
– Measures the entire sample according to ISO 13 320
– Programmable obscuration setting for optimized sample feeding
– User-selectable vacuum pressure for maximum dispersion control
Advantages of the LS 13 320 Particle Size Analyzer
Excellent Data Reproducibility
Reproducibility is one of the most important factors in laser diffraction particle size analysis. Tighter product specifications enable the production of higher-quality bulk and particulate materials.
Measurement parameters: Particle size, particle size distribution
Measurement methods: Light diffraction, PIDS method
Measuring range: 0.017 μm to 2000 μm
Applications: Particle size measurement
Materials: Emulsions such as lotions and creams, dispersions such as paints and PCD
Software version 5.01
Voltage: 100-220/240 V
Including vacuum pump controller
Further products – new and used – can be found in our shop!
International shipping costs on request!
Oglas je bil preveden samodejno, zaradi česar je morda prišlo do napak pri prevodu.
Ponudnik
Opomba: Brezplačno se registrirajte ali prijavite, za dostop do vseh informacij.
Registriran od: 2008
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